File:Riedel-research-estimation-and-optimization-of-reliability-of-noisy-digital-circuits-86a73b03.jpg: Difference between revisions

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Latest revision as of 16:49, 20 August 2026

Source

Figure excerpted from Estimation and Optimization of Reliability of Noisy Digital Circuits. Marc Riedel is an author of the paper.

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Date/TimeThumbnailDimensionsUserComment
current16:49, 20 August 2026Thumbnail for version as of 16:49, 20 August 2026451 × 185 (14 KB)MarcRiedel (talk | contribs)Use a tighter, source-native crop and preserve the figure aspect ratio
23:56, 18 August 2026Thumbnail for version as of 23:56, 18 August 2026450 × 167 (11 KB)MarcRiedel (talk | contribs)Add visual for the redesigned research publications page

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